Direct observation of ZnSe-ZnTe strained layer superlattice was performed by transmission electron microscopy. The long periodicity of the superlattice was confirmed by the satellite spots of transmissin electron diffraction. The bright field TEM image indicated the superlattice structure without large scale misfit dislocations.
|ジャーナル||Transactions of the Institute of Electronics and Communication Engineers of Japan. Section E|
|出版ステータス||Published - 1986 4|
|イベント||Pap from 1986 Natl Conv IECE Jpn - Niigata, Jpn|
継続期間: 1986 3 23 → 1986 3 26
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