Structure analysis of Ag overlayers on Si(111) by low-energy Li+ ion scattering

M. Aono, R. Souda, C. Oshima, Y. Ishizawa

    研究成果: Article

    54 引用 (Scopus)

    抄録

    The structures of various Ag overlayers on the Si(111) surface have been analyzed by impact-collision ion scattering spectroscopy (ICISS) using a beam of Li+ ions of ≈ 1 keV. The Ag overlayers include (i) Ag crystallites deposited at room temperature, (ii) Ag atoms at the Si(111)-(√3×√3)Ag surface, (iii) Ag atoms at the Si(111)-(3×1)Ag surface, and (iv) a (111) epitaxial film of Ag with a thickness of ≈ 20 A ̊.

    元の言語English
    ページ(範囲)713-723
    ページ数11
    ジャーナルSurface Science
    168
    発行部数1-3
    DOI
    出版物ステータスPublished - 1986 3 3

    Fingerprint

    ion scattering
    Scattering
    Ions
    Atoms
    Epitaxial films
    Crystallites
    crystallites
    atoms
    energy
    Spectroscopy
    collisions
    room temperature
    spectroscopy
    ions
    Temperature

    ASJC Scopus subject areas

    • Physical and Theoretical Chemistry
    • Condensed Matter Physics
    • Surfaces and Interfaces

    これを引用

    Structure analysis of Ag overlayers on Si(111) by low-energy Li+ ion scattering. / Aono, M.; Souda, R.; Oshima, C.; Ishizawa, Y.

    :: Surface Science, 巻 168, 番号 1-3, 03.03.1986, p. 713-723.

    研究成果: Article

    Aono, M. ; Souda, R. ; Oshima, C. ; Ishizawa, Y. / Structure analysis of Ag overlayers on Si(111) by low-energy Li+ ion scattering. :: Surface Science. 1986 ; 巻 168, 番号 1-3. pp. 713-723.
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