Structures and optical properties of defects correlated with photo-induced refractive index changes in Ge-doped SiO2 glass

Makoto Fujimaki, Yoshimichi Ohki

研究成果: Article査読

2 被引用数 (Scopus)

抄録

Photosensitivity of Ge-doped SiO2 glass is closely related to defect formation with ultraviolet photon irradiation. In the present paper, optical properties of Ge oxygen deficient centers, which are involved in the defect formation, are reviewed. Furthermore, structures and generation mechanisms of the photo-induced defects are discussed.

本文言語English
ページ(範囲)43-50
ページ数8
ジャーナルDiffusion and Defect Data. Pt A Defect and Diffusion Forum
177
出版ステータスPublished - 2000 1 1

ASJC Scopus subject areas

  • Radiation
  • Materials Science(all)
  • Condensed Matter Physics

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