Study of Multilayer X-ray Absorbers to Improve Detection Efficiency of TES X-ray Microcalorimeter Arrays

T. Hayashi, K. Nagayoshi, H. Muramatsu, N. Y. Yamasaki, K. Mitsuda, Mikiko Saito, Takayuki Homma, T. Hara, H. Noda

研究成果: Article

1 引用 (Scopus)

抄録

We report the fabrication and evaluation of the Cu/Bi bilayer absorber with electrodeposition. We designed the Cu/Bi absorber to satisfy the requirements for scanning transmission electron microscope (STEM). The residual resistivity ratios of films of Cu and Bi with electrodeposition was (Formula presented.) and (Formula presented.), respectively; these values are sufficient for the requirements of STEM. We found that the Cu/Bi bilayer absorber TES microcalorimeter experienced a pulse-shape variation and we considered that these variations were caused by the quality of the contact surface between the absorber and TES. In addition, we examined the structure of the absorber using focus ion beam analysis and STEM. The results suggest that an oxidation between the Cu and seed layer, in which the layer is an electrode for electrodeposition, yielded variations. Moreover, thermal simulation suggests that the thermal conduction between the absorber and TES caused variations. The results of this study will improve the process of Bi electrodeposition.

元の言語English
ページ(範囲)1-6
ページ数6
ジャーナルJournal of Low Temperature Physics
DOI
出版物ステータスAccepted/In press - 2016 3 28

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Electrodeposition
calorimeters
absorbers
Multilayers
electrodeposition
X rays
Electron microscopes
Scanning
x rays
electron microscopes
scanning
Ion beams
thermal simulation
Seed
requirements
Fabrication
Oxidation
Electrodes
TES
seeds

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Atomic and Molecular Physics, and Optics
  • Materials Science(all)

これを引用

Study of Multilayer X-ray Absorbers to Improve Detection Efficiency of TES X-ray Microcalorimeter Arrays. / Hayashi, T.; Nagayoshi, K.; Muramatsu, H.; Yamasaki, N. Y.; Mitsuda, K.; Saito, Mikiko; Homma, Takayuki; Hara, T.; Noda, H.

:: Journal of Low Temperature Physics, 28.03.2016, p. 1-6.

研究成果: Article

Hayashi, T. ; Nagayoshi, K. ; Muramatsu, H. ; Yamasaki, N. Y. ; Mitsuda, K. ; Saito, Mikiko ; Homma, Takayuki ; Hara, T. ; Noda, H. / Study of Multilayer X-ray Absorbers to Improve Detection Efficiency of TES X-ray Microcalorimeter Arrays. :: Journal of Low Temperature Physics. 2016 ; pp. 1-6.
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AU - Hayashi, T.

AU - Nagayoshi, K.

AU - Muramatsu, H.

AU - Yamasaki, N. Y.

AU - Mitsuda, K.

AU - Saito, Mikiko

AU - Homma, Takayuki

AU - Hara, T.

AU - Noda, H.

PY - 2016/3/28

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N2 - We report the fabrication and evaluation of the Cu/Bi bilayer absorber with electrodeposition. We designed the Cu/Bi absorber to satisfy the requirements for scanning transmission electron microscope (STEM). The residual resistivity ratios of films of Cu and Bi with electrodeposition was (Formula presented.) and (Formula presented.), respectively; these values are sufficient for the requirements of STEM. We found that the Cu/Bi bilayer absorber TES microcalorimeter experienced a pulse-shape variation and we considered that these variations were caused by the quality of the contact surface between the absorber and TES. In addition, we examined the structure of the absorber using focus ion beam analysis and STEM. The results suggest that an oxidation between the Cu and seed layer, in which the layer is an electrode for electrodeposition, yielded variations. Moreover, thermal simulation suggests that the thermal conduction between the absorber and TES caused variations. The results of this study will improve the process of Bi electrodeposition.

AB - We report the fabrication and evaluation of the Cu/Bi bilayer absorber with electrodeposition. We designed the Cu/Bi absorber to satisfy the requirements for scanning transmission electron microscope (STEM). The residual resistivity ratios of films of Cu and Bi with electrodeposition was (Formula presented.) and (Formula presented.), respectively; these values are sufficient for the requirements of STEM. We found that the Cu/Bi bilayer absorber TES microcalorimeter experienced a pulse-shape variation and we considered that these variations were caused by the quality of the contact surface between the absorber and TES. In addition, we examined the structure of the absorber using focus ion beam analysis and STEM. The results suggest that an oxidation between the Cu and seed layer, in which the layer is an electrode for electrodeposition, yielded variations. Moreover, thermal simulation suggests that the thermal conduction between the absorber and TES caused variations. The results of this study will improve the process of Bi electrodeposition.

KW - Bismuth

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KW - TES

KW - X-ray

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