抜粋
Nb-based Josephson junctions are photographically fabricated with an improved lift-off method. Aging properties of Nb/Pb junctions are studied and the possible origin of aging was pointed out, using the shape dependence and IJ-H characteristics. The I-V characteristics of Nb/Pb junctions were analyzed quantitatively using a proximity effect model based on McMillan's tunneling model. Maximum Josephson current was calculated incorporating the strong coupling correction. Theory and experiment agreed well for both pair and quasiparticle density of states.
| 元の言語 | English |
|---|---|
| ページ（範囲） | 4310-4316 |
| ページ数 | 7 |
| ジャーナル | Journal of Applied Physics |
| 巻 | 51 |
| 発行部数 | 8 |
| DOI | |
| 出版物ステータス | Published - 1980 12 1 |
| 外部発表 | Yes |
ASJC Scopus subject areas
- Physics and Astronomy(all)
フィンガープリント Study of Nb-based Josephson tunnel junctions' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。
これを引用
Matsuda, A., Inamura, T., & Yoshikiyo, H. (1980). Study of Nb-based Josephson tunnel junctions. Journal of Applied Physics, 51(8), 4310-4316. https://doi.org/10.1063/1.328250