We have investigated structural and magnetic properties of Ni and Ni 75Fe25 thin films evaporated on polyethylene naphtalate (PEN) organic substrates, which can be expected as electrodes of our proposed nanoscale junctions utilizing thin-film edges. As a result, there is no diffusion of Ni and Fe atoms into PEN substrates, resulting in clear and smooth formation of the interface. The surface roughness is also as small as 0.28-0.37 nm in the same scanning scale as the film thickness. As for the magnetic properties, the squareness of the hysteresis loop is as small as 0.24 for Ni/PEN, where there is no observation of the anisotropy magnetoresistance (AMR) effect. In contrast, the squareness of the hysteresis loop is as large as 0.95 for Ni75Fe25/PEN, where the AMR effect has been successfully obtained. These experimental results indicate that Ni 75Fe25/PEN is a promising material for use in electrodes of nanoscale junctions from the viewpoint of structural and magnetic properties.
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