Surface structural analysis of monolayer films composed of light elements by x-ray photoelectron diffraction

H. Nakamura, N. Fujihara, M. Nojima, K. Tamura, H. Ishii, M. Owari, C. Oshima, Y. Nihei*

*この研究の対応する著者

研究成果: Article査読

2 被引用数 (Scopus)

抄録

For surface structural analysis on monolayer films composed of light elements, we investigated theoretical x-ray photoelectron diffraction (XPED) patterns from single-molecule adsorbing surfaces by using both Cr La (572.8 eV) and Al Kα (1486.6 eV) excitations. Forward-scattering peaks and Kikuchi-like bands were clearly observed in the pattern excited by Al Kα. In contrast, the features of the XPED patterns excited by Cr La were more diffuse. However, the circular patterns excited by Cr La are clearer than those excited by Al Ka. This result suggests that the use of a lower energy x-ray source improves XPED structural analysis on ultrathin films composed of light elements.

本文言語English
ページ(範囲)1513-1515
ページ数3
ジャーナルSurface and Interface Analysis
36
12
DOI
出版ステータスPublished - 2004 12月

ASJC Scopus subject areas

  • 物理化学および理論化学
  • コロイド化学および表面化学

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