Surface structural analysis of monolayer films composed of light elements by x-ray photoelectron diffraction

H. Nakamura, N. Fujihara, M. Nojima, K. Tamura, H. Ishii, M. Owari, C. Oshima, Y. Nihei

研究成果: Article

2 引用 (Scopus)

抄録

For surface structural analysis on monolayer films composed of light elements, we investigated theoretical x-ray photoelectron diffraction (XPED) patterns from single-molecule adsorbing surfaces by using both Cr La (572.8 eV) and Al Kα (1486.6 eV) excitations. Forward-scattering peaks and Kikuchi-like bands were clearly observed in the pattern excited by Al Kα. In contrast, the features of the XPED patterns excited by Cr La were more diffuse. However, the circular patterns excited by Cr La are clearer than those excited by Al Ka. This result suggests that the use of a lower energy x-ray source improves XPED structural analysis on ultrathin films composed of light elements.

元の言語English
ページ(範囲)1513-1515
ページ数3
ジャーナルSurface and Interface Analysis
36
発行部数12
DOI
出版物ステータスPublished - 2004 12

Fingerprint

light elements
Photoelectrons
structural analysis
Structural analysis
Monolayers
photoelectrons
Diffraction
X rays
diffraction patterns
diffraction
Diffraction patterns
x rays
x ray sources
forward scattering
Forward scattering
Ultrathin films
Molecules
excitation
molecules
energy

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Colloid and Surface Chemistry

これを引用

Nakamura, H., Fujihara, N., Nojima, M., Tamura, K., Ishii, H., Owari, M., ... Nihei, Y. (2004). Surface structural analysis of monolayer films composed of light elements by x-ray photoelectron diffraction. Surface and Interface Analysis, 36(12), 1513-1515. https://doi.org/10.1002/sia.1935

Surface structural analysis of monolayer films composed of light elements by x-ray photoelectron diffraction. / Nakamura, H.; Fujihara, N.; Nojima, M.; Tamura, K.; Ishii, H.; Owari, M.; Oshima, C.; Nihei, Y.

:: Surface and Interface Analysis, 巻 36, 番号 12, 12.2004, p. 1513-1515.

研究成果: Article

Nakamura, H, Fujihara, N, Nojima, M, Tamura, K, Ishii, H, Owari, M, Oshima, C & Nihei, Y 2004, 'Surface structural analysis of monolayer films composed of light elements by x-ray photoelectron diffraction', Surface and Interface Analysis, 巻. 36, 番号 12, pp. 1513-1515. https://doi.org/10.1002/sia.1935
Nakamura, H. ; Fujihara, N. ; Nojima, M. ; Tamura, K. ; Ishii, H. ; Owari, M. ; Oshima, C. ; Nihei, Y. / Surface structural analysis of monolayer films composed of light elements by x-ray photoelectron diffraction. :: Surface and Interface Analysis. 2004 ; 巻 36, 番号 12. pp. 1513-1515.
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AU - Owari, M.

AU - Oshima, C.

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