Synchrotron radiation-induced total reflection X-ray fluorescence analysis

F. Meirer, A. Singh, P. Pianetta, G. Pepponi, F. Meirer, C. Streli, T. Homma

研究成果: Review article

34 引用 (Scopus)

抜粋

Synchrotron radiation-induced total reflection X-ray fluorescence (SR-TXRF) analysis is a high sensitive analytical technique that offers limits of detection in the femtogram range for most elements. Besides the analytical aspect, SR-TXRF is mainly used in combination with angle-dependent measurements and/or X-ray absorption near-edge structure (XANES) spectroscopy to gain additional information about the investigated sample. In this article, we briefly discuss the fundamentals of SR-TXRF and follow with several examples of recent research applying the above-mentioned combination of techniques to analytical problems arising from industrial applications and environmental research.

元の言語English
ページ(範囲)479-496
ページ数18
ジャーナルTrAC - Trends in Analytical Chemistry
29
発行部数6
DOI
出版物ステータスPublished - 2010 6 1

ASJC Scopus subject areas

  • Analytical Chemistry
  • Spectroscopy

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