Tapping mode atomic force microscopy analysis of the growth process of electroless nickel-phosphorus films on nonconducting surfaces

Takayuki Homma, Masayuki Tanabe, Kunimasa Itakura, Tetsuya Osaka

研究成果: Article査読

30 被引用数 (Scopus)

抄録

The growth process of etectroless nickel-phosphorous (NiP) films on nonconducting substrate was investigated quantitatively using tapping mode atomic force microscopy (TMAFM) with focus upon the nucleation density on the substrate surface. Three kinds of catalyzing processes were used for polyimide substrates to obtain nucleation densities of 900, 750, and 550 nuclei/μm2. The TMAFM observation showed that the film growth proceeds mainly through successive nucleation of fine "particles" with several nanometers in diameter and their three-dimensional growth, and that the nucleation density influences the state of aggregation of the particles and hence the resulting surface topography. The lower nucleation density developed the rougher surface with larger "grains" with a diameter of ca. 80 nm. However, the effect of nucleation density decayed with film growth and eventually vanished at a thickness of ca. 2000 nm due to successive nucleated. For comparison, the growth process of NiP on NiP coated Al substrate, which is used for rigid magnetic disk applications and has a higher nucleation density of 3000 nuclei/μm2, was also examined. This process resulted in a smooth surface without the formation of "aggregates." Based upon these results, the root-mean-square roughness and scaling analyses were performed to evaluate quantitatively the differences in growth process.

本文言語English
ページ(範囲)4123-4127
ページ数5
ジャーナルJournal of the Electrochemical Society
144
12
DOI
出版ステータスPublished - 1997 12

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 再生可能エネルギー、持続可能性、環境
  • 表面、皮膜および薄膜
  • 電気化学
  • 材料化学

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