TEM analysis of grain boundaries in SrTiO ₃-based semiconductor ceramics

Chemical Compounds

• Grain Boundary 100%
• Ceramic 74%
• Semiconductor 73%
• Transmission Electron Microscopy 63%
• Additive 13%
• Oxide(2-) 12%
• Diffusion 11%
• Nonconductor 10%
• Capacitor 9%
• Microstructure 6%
• Length 5%
• Amount 4%

Engineering & Materials Science

• Transmission electron microscopy 98%
• Grain boundaries 97%
• Semiconductor materials 85%
• Hot Temperature 9%
• Boundary layers 9%
• Oxides 8%
• Capacitors 7%
• Microstructure 6%
• Water 5%

Physics & Astronomy

• grain boundaries 71%
• ceramics 64%
• transmission electron microscopy 63%
• heat 12%
• matrices 10%
• diffusion length 10%
• capacitors 8%
• boundary layers 8%
• insulators 7%
• atmospheres 6%
• oxides 6%
• microstructure 5%
• water 5%