Temporal profile measurement of an electron bunch with the two-cell rf deflecting cavity at Waseda University

Kazuyuki Sakaue*, Yuichi Nishimura, Masahiro Nishiyama, Takenoshin Takahashi, Masakazu Washio, Toshikazu Takatomi, Junji Urakawa

*この研究の対応する著者

研究成果査読

7 被引用数 (Scopus)

抄録

Our group at Waseda University developed an rf deflector system for measuring longitudinal. In this study we evaluated the temporal resolution of an S-band two-cell rf deflector cavity built into the system and performed a series of longitudinal profile measurements of electron bunch from an rf photocathode gun. The rf deflector system achieved a temporal resolution of 147.6 fs (rms), the value gave in close agreement with the design specification. We present our experimental results and discussion how the temporal profile was influenced by the rf electric field and space charge effect in the electron bunch from the rf photo cathode gun. Our results agreed with the results of a beam tracking simulation. The successful results of longitudinal profile measurements in this study confirm that our deflector system will be quite useful for improving an rf electron gun cavities.

本文言語English
論文番号026301
ジャーナルJapanese journal of applied physics
54
2
DOI
出版ステータスPublished - 2015 2 1

ASJC Scopus subject areas

  • 工学(全般)
  • 物理学および天文学(全般)

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