Test data compression for scan-based BIST aiming at 100x compression rate

Masayuki Arai^*, Satoshi Fukumoto, Kazuhiko Iwasaki, Tatsuru Matsuo, Takahisa Hiraide, Hideaki Konishi, Michiaki Emori, Takashi Aikyo

^*この研究の対応する著者

研究成果: Article › 査読