抄録
The mean reflection and transmission coefficients of electromagnetic waves incident onto a two-dimensional slightly random dielectric surface are investigated by means of the stochastic functional approach. We discuss the shift of Brewster's scattering angle using the Wiener kernels and numerical calculations. It is also shown that the phase shift at the reflection into Brewster's angle for a flat surface does not depend on the rms height of the surface, but does on the correlation length of the surface.
| 本文言語 | English |
|---|---|
| ページ（範囲） | 1844-1848 |
| ページ数 | 5 |
| ジャーナル | IEICE Transactions on Electronics |
| 巻 | E83-C |
| 号 | 12 |
| 出版ステータス | Published - 2000 1月 1 |
| 外部発表 | はい |
ASJC Scopus subject areas
- 電子材料、光学材料、および磁性材料
- 電子工学および電気工学