The reliability of quantitative analysis with AES

K. Yoshihara, R. Shimizu, T. Homma, H. Tokutaka, K. Goto, D. Fujita, A. Kurokawa, S. Ichimura, M. Kurahashi, M. Kudo, Y. Hashiguchi, T. Suzuki, T. Ohmura, F. Soeda, K. Tanaka, A. Tanaka, T. Sekine, Y. Shiokawa, T. Hayashi

研究成果: Article

16 引用 (Scopus)

抜粋

The Japanese VAMAS‐SCA working group is composed of 19 institutes. Three kind of AuCu alloys (Au 75 at.‐%–Cu 25 at.‐%, Au 50 at.‐%–Cu 50 at.‐%, Au 25 at.‐%–Cu 75 at.‐%) were prepared, and these specimens, pure Au and pure Cu were distributed to the members of the VAMAS‐SCA working group. The surface concentrations of these alloys were calculated from the Auger peak amplitudes in two ways. One method used the published relative sensitivity factors, and the other used pure Au and Pure Cu as the standard materials. The mean values of the surface concentrations calculated with the published relative sensitivity factors were almost the same as those calculated with the standard materials. This means that the published relative sensitivity factors are reliable to some extent. The error of the surface concentration calculated with pure Au and pure Cu as the standard materials lay between about 3% and 10%, and that with the relative sensitivity factors lay between about 7% and 20%. The calculated surface concentrations of Au were larger than the bulk concentrations of Au when the matrix effect was neglected.

元の言語English
ページ(範囲)140-143
ページ数4
ジャーナルSurface and Interface Analysis
16
発行部数1-12
DOI
出版物ステータスPublished - 1990 7

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

フィンガープリント The reliability of quantitative analysis with AES' の研究トピックを掘り下げます。これらはともに一意のフィンガープリントを構成します。

  • これを引用

    Yoshihara, K., Shimizu, R., Homma, T., Tokutaka, H., Goto, K., Fujita, D., Kurokawa, A., Ichimura, S., Kurahashi, M., Kudo, M., Hashiguchi, Y., Suzuki, T., Ohmura, T., Soeda, F., Tanaka, K., Tanaka, A., Sekine, T., Shiokawa, Y., & Hayashi, T. (1990). The reliability of quantitative analysis with AES. Surface and Interface Analysis, 16(1-12), 140-143. https://doi.org/10.1002/sia.740160127