Theoretical Analysis of Longevity Testing on Bubble Memory Devices

Sadamu Ohteru, Tomokazu Kato, Yoshio Watanabe, Yuu Watanabe, Shuji Hashimoto

研究成果: Article査読

1 被引用数 (Scopus)

抄録

Theoretical results of magnetic bubble device long-term reliability testing are reported. The bubble during propagation along Permalloy tracks is represented by a simple, one-dimensional stochastic model. An equation to describe fluctuation in cylindrical bubble radius is approximated in the Langevin type stochastic differential equation, in which a set of small effects, such as interaction among bubbles and crystal nonuniformity, are considered as a white noise forcing term. Estimating the average time to bubble annihilation or runout (bubble memory mean time to failure) is reduced to a level-crossing problem for a random process. Calculated bias field margin degradation shows a qualitative agreement with experimental results for an actual bubble device. Bubble material parameters for obtaining maximum operation time are suggested.

本文言語English
ページ(範囲)1399-1403
ページ数5
ジャーナルIEEE Transactions on Magnetics
MAG-16
6
DOI
出版ステータスPublished - 1980
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 電子工学および電気工学

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