Thermal conductivity of SrVO3-SrTiO3 thin films: Evidence of intrinsic thermal resistance at the interface between oxide layers

T. Katsufuji, T. Saiki, S. Okubo, Y. Katayama, K. Ueno

研究成果: Article査読

6 被引用数 (Scopus)

抄録

By using a technique of thermoreflectance that can precisely measure the thermal conductivity of thin films, we found that the thermal conductivity of SrVO3-SrTiO3 multilayer thin films normal to the surface was substantially reduced by decreasing the thickness of each layer. This indicates that a large intrinsic thermal resistance exists at the interface between SrVO3 and SrTiO3 in spite of the similar phononic properties for these two compounds.

本文言語English
論文番号051002
ジャーナルPhysical Review Materials
2
5
DOI
出版ステータスPublished - 2018 5 8

ASJC Scopus subject areas

  • 材料科学(全般)
  • 物理学および天文学(その他)

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