Timing-aware diagnosis for small delay defects

Takashi Aikyo, Hiroshi Takahashi, Yoshinobu Higami, Junichi Ootsu, Kyohei Ono, Yuzo Takamatsu

研究成果: Conference contribution

10 被引用数 (Scopus)

抄録

As semiconductor technologies progress, testing of small delay defects are becoming more important for SoCs. However, fault diagnosis of small delay defects has not been developed. We propose a novel timing-aware method for diagnosing small delay defects with a small computation cost using gate delay fault simulation with the minimum detectable delay, as introduced in the statistical delay quality model. The experimental results show that the proposed method is capable of identifying fault locations for small delay defects with a small computation cost.

本文言語English
ホスト出版物のタイトルProceedings - 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007
ページ223-231
ページ数9
DOI
出版ステータスPublished - 2007
外部発表はい
イベント22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007 - Rome, Italy
継続期間: 2007 9月 262007 9月 28

出版物シリーズ

名前Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
ISSN(印刷版)1550-5774

Conference

Conference22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007
国/地域Italy
CityRome
Period07/9/2607/9/28

ASJC Scopus subject areas

  • 工学(全般)

フィンガープリント

「Timing-aware diagnosis for small delay defects」の研究トピックを掘り下げます。これらがまとまってユニークなフィンガープリントを構成します。

引用スタイル