@article{999e4ded57ff4271ad37f90c6ff7d90e,
title = "Transition Detector-Based Radiation-Hardened Latch for Both Single- And Multiple-Node Upsets",
abstract = "This brief presents an output transition detector-based radiation-hardened latch (TDRHL) for reliability improvement. With an error recovery assistant logic and an in-situ transition detector, for any radiation induced single- and double-node upsets, the proposed TDRHL can 1) provide full self-recovery capability and 2) generate a warning signal for architecture-level recovery when soft errors cause the latch output flipped. The evaluation results show that TDRHL outperforms state-of-the-art double-node upset tolerant designs with addition error detection capability, and up to 5.0X power-delay-product improvement can be achieved.",
keywords = "Radiation-hardened latch, low power, multiple node upsets, soft error, transition detector",
author = "Saki Tajima and Masao Yanagisawa and Youhua Shi",
note = "Funding Information: Manuscript received May 20, 2019; accepted June 27, 2019. Date of publication July 3, 2019; date of current version June 4, 2020. This work was supported in part by the cooperation of organization between Waseda University and Toshiba Memory Corporation. This brief was recommended by Associate Editor M. Chrzanowska-Jeske. (Corresponding author: Saki Tajima.) The authors are with the Department of Electronic and Physical Systems, Faculty of Fundamental Science and Engineering, Waseda University, Tokyo 1698555, Japan (e-mail: saki.tajima@islab.cs.waseda.ac.jp; youhua.shi@islab.cs.waseda.ac.jp). Publisher Copyright: {\textcopyright} 2004-2012 IEEE.",
year = "2020",
month = jun,
doi = "10.1109/TCSII.2019.2926498",
language = "English",
volume = "67",
pages = "1114--1118",
journal = "IEEE Transactions on Circuits and Systems II: Express Briefs",
issn = "1549-7747",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "6",
}