Transition Detector-Based Radiation-Hardened Latch for Both Single- And Multiple-Node Upsets

研究成果: Article

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This brief presents an output transition detector-based radiation-hardened latch (TDRHL) for reliability improvement. With an error recovery assistant logic and an in-situ transition detector, for any radiation induced single- and double-node upsets, the proposed TDRHL can 1) provide full self-recovery capability and 2) generate a warning signal for architecture-level recovery when soft errors cause the latch output flipped. The evaluation results show that TDRHL outperforms state-of-the-art double-node upset tolerant designs with addition error detection capability, and up to 5.0X power-delay-product improvement can be achieved.

元の言語English
記事番号8755273
ページ(範囲)1114-1118
ページ数5
ジャーナルIEEE Transactions on Circuits and Systems II: Express Briefs
67
発行部数6
DOI
出版物ステータスPublished - 2020 6

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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