This brief presents an output transition detector-based radiation-hardened latch (TDRHL) for reliability improvement. With an error recovery assistant logic and an in-situ transition detector, for any radiation induced single- and double-node upsets, the proposed TDRHL can 1) provide full self-recovery capability and 2) generate a warning signal for architecture-level recovery when soft errors cause the latch output flipped. The evaluation results show that TDRHL outperforms state-of-the-art double-node upset tolerant designs with addition error detection capability, and up to 5.0X power-delay-product improvement can be achieved.
|ジャーナル||IEEE Transactions on Circuits and Systems II: Express Briefs|
|出版ステータス||Published - 2020 6|
ASJC Scopus subject areas
- Electrical and Electronic Engineering