Transmission electron microscopy of Co2(Cr1-xFex)Al sputtered films and their magnetic tunneling junctions

Y. K. Takahashi; T. Ohkubo; K. Hono; S. Okamura; N. Tezuka; K. Inomata

doi:10.1016/j.jmmm.2006.09.023

Transmission electron microscopy of Co₂(Cr_1-xFe_x)Al sputtered films and their magnetic tunneling junctions

Y. K. Takahashi^*, T. Ohkubo, K. Hono, S. Okamura, N. Tezuka, K. Inomata

^*この研究の対応する著者

研究成果: Article › 査読

7 被引用数 (Scopus)

抄録

The microstructures of Co₂FeAl and Co₂(Cr_0.4Fe_0.6)Al sputtered films and of their magnetic tunnel junctions (MTJs) have been investigated to discuss the possible reasons for an unexpectedly low tunneling magnetoresistance (TMR). The structure of the Co₂FeAl film changed from B2 to L2₁ with increasing substrate temperature, while that of the Co₂(Cr_0.4Fe_0.6)Al film remained B2 up to 500 °C. The thermodynamically predicted phase separation was not observed in the films. The low TMR values obtained from the MTJs using the Co₂FeAl and Co₂(Cr_0.4Fe_0.6)Al films are attributed to the low-spin polarization expected from the low degree of order in these films. The TMR values depend sensitively on the interfacial structure of the tunnel junctions when the degree of order of the film is low.

本文言語	English
ページ（範囲）	378-382
ページ数	5
ジャーナル	Journal of Magnetism and Magnetic Materials
巻	313
号	2
DOI	https://doi.org/10.1016/j.jmmm.2006.09.023
出版ステータス	Published - 2007 6月
外部発表	はい

ASJC Scopus subject areas

電子材料、光学材料、および磁性材料
凝縮系物理学

文献へのアクセス

10.1016/j.jmmm.2006.09.023

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引用スタイル

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title = "Transmission electron microscopy of Co2(Cr1-xFex)Al sputtered films and their magnetic tunneling junctions",

abstract = "The microstructures of Co2FeAl and Co2(Cr0.4Fe0.6)Al sputtered films and of their magnetic tunnel junctions (MTJs) have been investigated to discuss the possible reasons for an unexpectedly low tunneling magnetoresistance (TMR). The structure of the Co2FeAl film changed from B2 to L21 with increasing substrate temperature, while that of the Co2(Cr0.4Fe0.6)Al film remained B2 up to 500 °C. The thermodynamically predicted phase separation was not observed in the films. The low TMR values obtained from the MTJs using the Co2FeAl and Co2(Cr0.4Fe0.6)Al films are attributed to the low-spin polarization expected from the low degree of order in these films. The TMR values depend sensitively on the interfacial structure of the tunnel junctions when the degree of order of the film is low.",

keywords = "Co(CrFe)Al film, Magnetic tunnel junctions, Microstructure",

author = "Takahashi, {Y. K.} and T. Ohkubo and K. Hono and S. Okamura and N. Tezuka and K. Inomata",

note = "Funding Information: This work was in part supported by the Ministry of Education, Science, Sports, and Culture, Grant-in-Aid for Scientific Research (B), 17360346, 2005.",

year = "2007",

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AU - Takahashi, Y. K.

AU - Ohkubo, T.

AU - Hono, K.

AU - Okamura, S.

AU - Tezuka, N.

AU - Inomata, K.

N1 - Funding Information: This work was in part supported by the Ministry of Education, Science, Sports, and Culture, Grant-in-Aid for Scientific Research (B), 17360346, 2005.

PY - 2007/6

Y1 - 2007/6

N2 - The microstructures of Co2FeAl and Co2(Cr0.4Fe0.6)Al sputtered films and of their magnetic tunnel junctions (MTJs) have been investigated to discuss the possible reasons for an unexpectedly low tunneling magnetoresistance (TMR). The structure of the Co2FeAl film changed from B2 to L21 with increasing substrate temperature, while that of the Co2(Cr0.4Fe0.6)Al film remained B2 up to 500 °C. The thermodynamically predicted phase separation was not observed in the films. The low TMR values obtained from the MTJs using the Co2FeAl and Co2(Cr0.4Fe0.6)Al films are attributed to the low-spin polarization expected from the low degree of order in these films. The TMR values depend sensitively on the interfacial structure of the tunnel junctions when the degree of order of the film is low.

AB - The microstructures of Co2FeAl and Co2(Cr0.4Fe0.6)Al sputtered films and of their magnetic tunnel junctions (MTJs) have been investigated to discuss the possible reasons for an unexpectedly low tunneling magnetoresistance (TMR). The structure of the Co2FeAl film changed from B2 to L21 with increasing substrate temperature, while that of the Co2(Cr0.4Fe0.6)Al film remained B2 up to 500 °C. The thermodynamically predicted phase separation was not observed in the films. The low TMR values obtained from the MTJs using the Co2FeAl and Co2(Cr0.4Fe0.6)Al films are attributed to the low-spin polarization expected from the low degree of order in these films. The TMR values depend sensitively on the interfacial structure of the tunnel junctions when the degree of order of the film is low.

KW - Co(CrFe)Al film

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