Transmission electron microscopy of Co2(Cr1-xFex)Al sputtered films and their magnetic tunneling junctions

Y. K. Takahashi, T. Ohkubo, K. Hono, S. Okamura, N. Tezuka, K. Inomata

研究成果: Article査読

6 被引用数 (Scopus)

抄録

The microstructures of Co2FeAl and Co2(Cr0.4Fe0.6)Al sputtered films and of their magnetic tunnel junctions (MTJs) have been investigated to discuss the possible reasons for an unexpectedly low tunneling magnetoresistance (TMR). The structure of the Co2FeAl film changed from B2 to L21 with increasing substrate temperature, while that of the Co2(Cr0.4Fe0.6)Al film remained B2 up to 500 °C. The thermodynamically predicted phase separation was not observed in the films. The low TMR values obtained from the MTJs using the Co2FeAl and Co2(Cr0.4Fe0.6)Al films are attributed to the low-spin polarization expected from the low degree of order in these films. The TMR values depend sensitively on the interfacial structure of the tunnel junctions when the degree of order of the film is low.

本文言語English
ページ(範囲)378-382
ページ数5
ジャーナルJournal of Magnetism and Magnetic Materials
313
2
DOI
出版ステータスPublished - 2007 6
外部発表はい

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学

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