Ultrafast near-field microscopy of single gold nanoparticles

K. Imura, H. Okamoto

研究成果: Conference contribution

抜粋

We investigated near-field optical properties and images of single gold nanorods by using a near-field optical microscope. Observed transmission spectra show distinct transverse and longitudinal surface plasmon resonances. Transmission images observed near the surface plasmon resonances agree qualitatively with calculated maps of optical local density-of-states, and are assignable to plasmon wavefunctions. Ultrafast temporal responses in the single gold nanoparticles were observed by combining a near-field microscope with time-resolved techniques. Observed transient transmission images of the single nanorods show characteristic optical features, and are in good agreement with a calculated map of variation of local density of states arising from the elevation of electronic temperature in the nanorod induced by photoexcitation.

元の言語English
ホスト出版物のタイトルUltrafast Phenomena in Semiconductors and Nanostructure Materials XI and Semiconductor Photodetectors IV
DOI
出版物ステータスPublished - 2007 5 24
外部発表Yes
イベントUltrafast Phenomena in Semiconductors and Nanostructure Materials XI and Semiconductor Photodetectors IV - San Jose, CA, United States
継続期間: 2007 1 222007 1 24

出版物シリーズ

名前Proceedings of SPIE - The International Society for Optical Engineering
6471
ISSN(印刷物)0277-786X

Conference

ConferenceUltrafast Phenomena in Semiconductors and Nanostructure Materials XI and Semiconductor Photodetectors IV
United States
San Jose, CA
期間07/1/2207/1/24

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • これを引用

    Imura, K., & Okamoto, H. (2007). Ultrafast near-field microscopy of single gold nanoparticles. : Ultrafast Phenomena in Semiconductors and Nanostructure Materials XI and Semiconductor Photodetectors IV [647103] (Proceedings of SPIE - The International Society for Optical Engineering; 巻数 6471). https://doi.org/10.1117/12.696994