Unknown response masking with minimized observable response loss and mask data

Youhua Shi*, Nozomu Togawa, Masao Yanagisawa, Tatsuo Ohtsuki

*この研究の対応する著者

研究成果: Conference contribution

抄録

This paper presents a new unknown response masking technique to minimize the effect on test loss due to over-masking. Unlike previous works where the scan responses are masked before entering the response compactor, the proposed method could mask the Xs when they are transformed on the scan path. Meanwhile, the masking cells are inserted along the scan paths, thus they would have no degradation on the performance of the designs. In addition, the test data required to mask unknown responses is only one bit for each test pattern. Experimental results show the effectiveness of the proposed method.

本文言語English
ホスト出版物のタイトルProceedings of APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems
ページ1779-1781
ページ数3
DOI
出版ステータスPublished - 2008 12 1
イベントAPCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems - Macao, China
継続期間: 2008 11 302008 12 3

出版物シリーズ

名前IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS

Conference

ConferenceAPCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems
国/地域China
CityMacao
Period08/11/3008/12/3

ASJC Scopus subject areas

  • 電子工学および電気工学

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