Unknown response masking with minimized observable response loss and mask data

研究成果: Conference contribution

抜粋

This paper presents a new unknown response masking technique to minimize the effect on test loss due to over-masking. Unlike previous works where the scan responses are masked before entering the response compactor, the proposed method could mask the Xs when they are transformed on the scan path. Meanwhile, the masking cells are inserted along the scan paths, thus they would have no degradation on the performance of the designs. In addition, the test data required to mask unknown responses is only one bit for each test pattern. Experimental results show the effectiveness of the proposed method.

元の言語English
ホスト出版物のタイトルProceedings of APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems
ページ1779-1781
ページ数3
DOI
出版物ステータスPublished - 2008 12 1
イベントAPCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems - Macao, China
継続期間: 2008 11 302008 12 3

出版物シリーズ

名前IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS

Conference

ConferenceAPCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems
China
Macao
期間08/11/3008/12/3

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • これを引用

    Shi, Y., Togawa, N., Yanagisawa, M., & Ohtsuki, T. (2008). Unknown response masking with minimized observable response loss and mask data. : Proceedings of APCCAS 2008 - 2008 IEEE Asia Pacific Conference on Circuits and Systems (pp. 1779-1781). [4746386] (IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS). https://doi.org/10.1109/APCCAS.2008.4746386