TY - JOUR
T1 - Verification of the Astro-E Hard X-ray Detector based on newly developed Ground Support Equipment
AU - Kataoka, J.
AU - Nomachi, M.
AU - Takahashi, T.
AU - Kawaguchi, G.
AU - Terada, Y.
AU - Murakami, T.
AU - Tanihata, C.
AU - Uchiyama, Y.
AU - Yamaoka, K.
AU - Fukazawa, Y.
AU - Kamae, T.
AU - Makishima, K.
AU - Tashiro, M.
AU - Kubo, H.
PY - 1998/12/1
Y1 - 1998/12/1
N2 - We report the first results of the ground test of the Hard X-ray Detector (HXD) on board the Astro-E mission, by means of the newly developed Ground Support Equipment (GSE). Astro-E will be launched in 2000 by a Japanese M-V rocket. In order to verify the detector system during the limited time before launch, fast and versatile GSE is necessary. For this, we have developed a flexible test system based on nine VME I/O boards for a SUN workstation. These boards carry reconfigurable Field Programmable Gate Arrays (FPGAs) with 50,000 gates, together with 1 Mbyte SRAM devices tightly coupled to each FPGA device. As an application of using this GSE, we have tested the performance of a phoswich unit of the Flight Model of the HXD. In this paper, we present a schematic view of the GSE highlighting the functional design, and the results of our ground test of the HXD-sensor under the high count rate environment (approximately 10 kHz/unit) expected in orbit.
AB - We report the first results of the ground test of the Hard X-ray Detector (HXD) on board the Astro-E mission, by means of the newly developed Ground Support Equipment (GSE). Astro-E will be launched in 2000 by a Japanese M-V rocket. In order to verify the detector system during the limited time before launch, fast and versatile GSE is necessary. For this, we have developed a flexible test system based on nine VME I/O boards for a SUN workstation. These boards carry reconfigurable Field Programmable Gate Arrays (FPGAs) with 50,000 gates, together with 1 Mbyte SRAM devices tightly coupled to each FPGA device. As an application of using this GSE, we have tested the performance of a phoswich unit of the Flight Model of the HXD. In this paper, we present a schematic view of the GSE highlighting the functional design, and the results of our ground test of the HXD-sensor under the high count rate environment (approximately 10 kHz/unit) expected in orbit.
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M3 - Conference article
AN - SCOPUS:0032299383
VL - 3445
SP - 143
EP - 154
JO - Proceedings of SPIE - The International Society for Optical Engineering
JF - Proceedings of SPIE - The International Society for Optical Engineering
SN - 0277-786X
T2 - Proceedings of the 1998 Conference on EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy IX
Y2 - 22 July 1998 through 24 July 1998
ER -