Versatile approach for frequency resolved wavefront characterization

Eugene Frumker*, Gerhard G. Paulus, Hiromichi Niikura, David M. Villeneuve, Paul B. Corkum


研究成果: Conference contribution


Spatial characterization of high harmonics (HH) and XUV coherent radiation is of paramount importance, along with its temporal characterization. For many applications it will be necessary to accurately measure the beam properties, just as it is important to know the beam characteristics for many laser experiments. For example, high harmonics and attosecond pulses are being proposed as a front-end for the next generation X-ray free electron lasers. This oscillator-amplifier-like arrangement will require well characterized high harmonic sources. On the other hand, the electromagnetic radiation carries the combined signature of underlying quantum physical processes at the molecular level and of the cooperative phase matching. For example, accurate reconstruction of the high harmonic spatial wavefront, along with its temporal profile, gives us a complete range of tools to apply to the fundamental quantum properties and dynamics associated with high harmonic generation. We present a new concept of frequency resolved wavefront characterization that is particularly suitable for characterizing XUV radiation. In keeping with tradition in the area we give it an acronym - SWORD (Spectral Wavefront Optical Reconstruction by Diffraction). Our approach is based on an analysis of the diffraction pattern of a slit situated in front of a flat-field spectrometer. As the slit is scanned, the spectrally resolved diffraction pattern is recorded. Analyzing the measured diffractogram, we can reconstruct the wavefront. The technique can be easily extended beyond the XUV spectral region. When combined with temporal characterization techniques all information about the beam can be measured.

ホスト出版物のタイトルFrontiers in Ultrafast Optics
ホスト出版物のサブタイトルBiomedical, Scientific, and Industrial Applications XI
出版ステータスPublished - 2011
イベントFrontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XI - San Francisco, CA, United States
継続期間: 2011 1月 232011 1月 26


名前Proceedings of SPIE - The International Society for Optical Engineering


ConferenceFrontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XI
国/地域United States
CitySan Francisco, CA

ASJC Scopus subject areas

  • 電子材料、光学材料、および磁性材料
  • 凝縮系物理学
  • コンピュータ サイエンスの応用
  • 応用数学
  • 電子工学および電気工学


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