X-ray nanospectroscopy for attogram-scale two-dimensional nanomaterials using photoelectron emission microscopy

Y. Kotani, T. Taniuchi, M. Osada, T. Sasaki, M. Kotsugi, T. Ohkochi, Y. Watanabe, K. Ono

研究成果: Conference contribution

抄録

We have demonstrated x-ray nanospectroscopy for two-dimensional nanomaterials with attogram (=10-18gram) weight samples. The x-ray nanospectroscopic characterization of the nanomaterials was performed using SPELEEM (Spectroscopic Photoemission and Low Energy Electron Microscopy) at BL17SU of the SPring-8 in Japan. For quantitative x-ray absorption spectroscopy analysis with high spatial resolution and high stability during the photon energy scan, we have implemented a sample drift correction and a uniform lighting correction by image analysis. Using these corrections, the x-ray absorption spectra from 80nm×80nm. area are significantly improved and the layer-dependent electronic structure analysis is also demonstrated.

本文言語English
ホスト出版物のタイトルAIP Conference Proceedings
ページ437-440
ページ数4
1234
DOI
出版ステータスPublished - 2010
外部発表はい
イベント10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009 - Melbourne, VIC, Australia
継続期間: 2009 9 272009 10 2

Other

Other10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009
CountryAustralia
CityMelbourne, VIC
Period09/9/2709/10/2

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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