We have demonstrated x-ray nanospectroscopy for two-dimensional nanomaterials with attogram (=10-18gram) weight samples. The x-ray nanospectroscopic characterization of the nanomaterials was performed using SPELEEM (Spectroscopic Photoemission and Low Energy Electron Microscopy) at BL17SU of the SPring-8 in Japan. For quantitative x-ray absorption spectroscopy analysis with high spatial resolution and high stability during the photon energy scan, we have implemented a sample drift correction and a uniform lighting correction by image analysis. Using these corrections, the x-ray absorption spectra from 80nm×80nm. area are significantly improved and the layer-dependent electronic structure analysis is also demonstrated.
|ホスト出版物のタイトル||AIP Conference Proceedings|
|出版ステータス||Published - 2010|
|イベント||10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009 - Melbourne, VIC, Australia|
継続期間: 2009 9月 27 → 2009 10月 2
|Other||10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009|
|Period||09/9/27 → 09/10/2|
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